Thin Film Testing

Platypus Technologies offers services in testing and characterization of thin films.  Our capabilities include:

• Ellipsometry
• Optical microscopy and image analysis
• UV/Vis spectroscopy
• Electrochemical impedance spectroscopy
• Cyclic voltammetry, amperometry, potentiometry
• Electrical testing (inductance, capacitance, resistance, sheet resistance)
• Gas chromatography

Ellipsometry is an optical technique that uses polarized light to non-destructively measure the thickness and optical constants of thin films on glass or silicon. This method is ideal for semitransparent and transparent thin films.

We also offer a range of spectroscopy services that analyze the structure and composition of different structures. Ultraviolet-visible spectroscopy is commonly used to determine the degree a chemical substance absorbs light.

Electrochemical impedance spectroscopy (EIS) can be utilized to study the electrical interfacial properties of materials and thin films.

Our dedicated team of Ph.D.-level scientist and engineers has years of experience working with self-assembled monolayers, thin films, metals, metal oxides, polymers, and nanostructured surfaces.  Contact us today to integrate our engineer’s expertise into your next R&D project!