Platypus Technologies offers services in testing and characterization of thin films. Our capabilities include:
- Optical microscopy and image analysis
- UV/Vis spectroscopy
- Electrochemical impedance spectroscopy
- Cyclic voltammetry, amperometry, potentiometry
- Electrical testing (inductance, capacitance, resistance, sheet resistance)
- Gas chromatography
Ellipsometry is an optical technique that uses polarized light to non-destructively measure the thickness and optical constants of thin films on glass or silicon. This method is ideal for semitransparent and transparent thin films.
We also offer a range of spectroscopy services that analyze the structure and composition of different structures. Ultraviolet-visible spectroscopy is commonly used to determine the degree a chemical substance absorbs light.
Electrochemical impedance spectroscopy (EIS) can be utilized to study the electrical interfacial properties of materials and thin films.
Our dedicated team of Ph.D.-level scientist and engineers has years of experience working with self-assembled monolayers, thin films, metals, metal oxides, polymers, and nanostructured surfaces. Contact us today to integrate our engineer’s expertise into your next R&D project!