Platypus Technologies offers services in testing and characterization of thin films.
Our capabilities include
- Contact angle/surface energy measurements
- Optical microscopy
- UV/Vis spectroscopy
- LCR impedance spectroscopy
- Gas chromatography
Ellipsometry is an optical technique that uses polarized light to non-destructively measure the thickness and optical constants of thin films on glass or silicon. This method is ideal for semitransparent and transparent thin films.
Contact angle refers to an angle formed by a liquid at the 3-phase boundary (liquid, gas, solid). Generating the contact angle involves the measure of wetting of a solid by a liquid. As the contact angle of a surface increases, the surface energy and tension of the surface also rise. This information can indicate the extent of wettability of a liquid on a surface.
We also offer a range of spectroscopy services that analyze the structure and composition of different structures. Ultraviolet-visible spectroscopy is commonly used to determine the degree a chemical substance absorbs light. Impedance spectroscopy can be utilized when investigating the electrical properties of materials and thin films.
Our dedicated team of Ph.D.-level scientist and engineers has years of experience working with self-assembled monolayers, thin films, metals, metal oxides, polymers, and nanostructured surfaces. Contact us today to integrate our engineer’s expertise into your next R&D project!